My research interest lies in understanding the fundamental physics of materials and developing effective models to describe the observed phenomena. Over the years, I have worked extensively on ferroelectric and piezoelectric materials, using scanning probe microscopy (SPM), particularly piezoresponse force microscopy (PFM), to gain a deeper understanding of the behaviors of ferroelectric domains.
Currently, my research focuses on studying silicon oxides and zeolites. To analyze their properties, I am using a combination of X-ray crystal structure refinement and versatile techniques of optimization problem-solving and image data analysis.
In addition to experimental techniques, I have expertise in computational methods, specifically phase field simulations. I believe that combining experimental and computational approaches can provide a more comprehensive understanding of materials and their properties.
